SPP Teclorogy

PECVD

PECVD

SPT’s PECVD system is designed for reliable deposition of thick oxide and low-stress silicon nitride in advanced MEMS and semiconductor applications.

Cetus, Capella

SPT’s plasma-enhanced chemical vapor deposition (PECVD) system delivers high-quality silicon oxide and silicon nitride films with low stress, excellent uniformity, and reliable step coverage.
Designed for MEMS, optical coatings, and passivation films across a wide range of thicknesses.

Applications:

  • MEMS Devices
  • Inkjet Printheads
  • Through-Silicon Via (TSVs)
  • Power Devices
  • LED Devices
  • Optical Devices
  • RF Devices (Radio Frequency Devices)

Features

Why Choose SPT for High-Precision PECVD

High-Speed, Crack-Free Oxide Films

Enables fast deposition of thick SiO₂ layers for MEMS and optical waveguide applications, without cracks or voids.

Excellent Step Coverage for TSV Structures

Deposits low-temperature silicon oxide with high conformity on narrow, high-aspect-ratio TSV features.

High-Quality SiN with Low Hydrogen Content

Ideal for passivation of compound semiconductors, delivering dense silicon nitride films with minimal hydrogen.

Low-Stress SiN for MEMS Membranes

Forms high-uniformity silicon nitride films with ultra-low stress for critical membrane applications.

Scalable Platform for R&D to Production

Offered in vacuum load-lock and cluster tool formats to support a wide range of production needs.

Performance

Reliable Thick Oxides and Low-Stress SiN

SPT’s PECVD system delivers thick oxides, low-stress SiN, and conformal films for demanding MEMS and TSV structures.
Get the results that matter—with proven reliability and process control.

Void-Free Oxide Fill for TSV Structures

Thick Silicon Oxide Film Deposition

Low-Stress SiN Deposition

(Courtesy of Cambridge Univ.)

Conformal Oxide Deposition over Aluminum Interconnects

Specifications

Flexible PECVD System Architecture: Configure for Your Device and Process Needs

SPT’s PECVD systems offer flexible configurations to meet diverse film thickness, material, and device requirements. Ideal for both R&D and production, with stable oxide and nitride deposition across applications.

Process Module

  • Cetus

  • Capella

  • Wafer size (mm)

  • 200

  • 200

  • Platform

  • APX, DPX, VPX, CPX

  • APX, DPX, VPX, CPX

  • Process Temperature

  • Moderate

  • ≤100°C

  • Deposition Materials

  • SiO2, SiN, SiON, SiC

  • SiO2, SiN

Platform

  • APX

  • DPX

  • VPX

  • CPX

  • Intended Use

  • R&D

  • Prototype

  • Small Volume

  • Mass Production

  • Number of Chambers

  • 1

  • 2

  • 3

  • 4

  • Cassette Transfer Robot

  • Atmospheric

  • Vacuum

  • Vacuum

  • Robot Motion

  • 2-Axis

  • 2-Axis

  • 3-Axis

  • 3-Axis

  • Number of Cassette Stations

  • 0

  • 2

  • 1

  • 2

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      **We do not accept any sales proposals via our website.